Laboratorium Mikroskopii Elektronowej -- Aparatura [en].

Scanning elektron microscopy - JSM 6480 (JEOL)

Specification:

acceleration voltage – 5 - 30 kV, resolution – 3 nm.

Attachements:

EDS spectrometer. EBSD, heating sample holder, extension sample holder. 

Transmission Electron Microscopy

High Resolution Transmission Electron Microscope – JEM-3010 (JEOL)

Specification:

Acceleration voltage – 300 kV, resolution: point resolution 0.17nm, line resolution- 0.14nm.

Attachements:

Gatan Orius CCD camera, EDS spectrometer (Oxford) for chemical analysis, heating and cooling sample holder, electron beam precession unit – DigiSTAR, system for orientation mapping – ASTAR.

Sample preparation setup:

Gatan Precision Ion Polishing System (PIPS ) x2,

XLA 2000 by South Bay Technology ion polisher (cooling stage).